Bersoft Image Measurement (BIM) is designed as a flexible tool for acquiring, measuring and analyzing digital images. The measurements may be done by pointing and clicking or in an automated way, when doing statistical or analytical measurements. BIM can load many different types of images, including DICOM files, and also supports image acquisition from most TWAIN scanners. Angle, distance, perimeter, area, point and line measurements may be done using by using the tools in the Tools Palette. Spatial calibration is available to provide real world dimensional measurements such as kilometers, centimeters, millimeters, nanometers, microns, cm, miles, etc,. for both linear and The measurements are drawn over a measurement layer, so the original image is not altered in any way.
Now includes an image Database.
For convenient further statistical analysis the measurements can be exported as CVS, HTML, DOC or ASCII file formats. They also can be send directly to Excel or copied and pasted to any other program.
Statistical measurement can be done either on a selected image area, the full image, or on several images at once.
Count, mean, median, minimum, maximum, range, variance, standard deviation, standard error, coefficient of variation, skew, kurtosis and frequencies are supported.
Images can be visualized and compared in different ways, using histograms (from images or selections), generating false color images, subtracting image backgrounds, merging images, adjusting brightness, gamma and contrast, inverting image colors, manipulating channels, applying spatial convolutions with user-defined convolution masks and morphing filters.
What's New in this Release: New find objects methods. Arc tool.
Link to Bersoft Image Measurement sample code
Platform: Win7 x32,Win7 x64,WinServer,WinVista,WinVista x64,WinXP
License: Free To Try
Business::Math & Scientific Tools
Date Added: Aug 05, 2012
Last check for an update: Mar 24, 2017
Last version date: Jan 16, 2017
Downloads Total : 2
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Page Visit: 117
Malware Status: Clean
Scan Date: Apr 21, 2008